Scanning Probe Microscopy

These sites provide methods and techniques used in SPM. Scanning probe microscopes image the surface by scanning the object usually with a sharp tip and piezoelectric feedback. Category includes but is not limited to Scanning Tunneling Microscopes (STM), Atomic Force Microscopes (AFM),Scanning Force Microscopes (SFM)and Scanning Near-Field Optical Microscopes (SNOM).

• Imaging Surfaces on a Fine Scale - Description of techniques and applications.
• Conference on Non-Contact AFM - August 15-18, 2005 conference in Germany for research scanning probe microscopy methods and techniques on force controlled imaging, spectroscopy and manipulation.
• Scanning Tunneling Microscopy - Image gallery of metal surfaces, generated at the microscopy IBM Almaden Research Center in San Jose, CA.
• Advanced Surface Microscopy, Inc. - Introduction to atomic force microscopy.
• SPM Application - Using scanning probe microscopy to explore and manipulate semiconductor surfaces. methods and techniques Department of Chemistry at McMaster University.
• Field Emission/Ion Microscopy Laboratory - A laboratory engaged in exclusive research on field emission and scanning probe microscopy field ion microscopy.
• University of Leuven, Belgium - The SPM Group - Scanning Probe Microscopy: introduction, research work, personnel, recent scanning probe microscopy methods and techniques publications (some .pdf), image gallery, equipment, collaborations and scanning probe microscopy methods and techniques links.

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